FEI Nova NanoSEM 630 Scanning Electron Microscope

Instrument/ServiceType:

Scanning Electron Microscope

Make/ Model:

FEI Nova NanoSEM 630

Instrument Description:

Performs electron microscopy. It can also be used to do electron beam lithography.

Keywords for the Instrument:

Mireau Interferometer, Image Capture, 3-Axis-Automated Stage

Instrument Website URL:

http://jila-kecklab.colorado.edu/

Primary Contact Name:

David Alchenberger

Email:alchenbd@jila.colorado.edu

Phone 303.492.2389

Home Department/Institute:

JILA

Home Facility:

JILA Keck Lab

Instrument Location:

JILA X131A

Instrument Availability to Campus Users:

Open on a case-by-case basis to the university users outside of the home department

Instrument Availability to External Academic and National Lab Users:

Open on a case-by-case basis to academic and national lab users